An application, often implemented as software or a web-based tool, facilitates the computation of angles or interplanar spacings in crystalline materials. These calculations are based on a principle relating the wavelength of incident radiation, the angle of incidence, and the distance between atomic layers in a crystal lattice. For example, given an X-ray wavelength and the angle at which a diffracted beam is observed, the tool can determine the spacing between the planes of atoms responsible for that diffraction.
The utility of such a calculation tool lies in its ability to aid in the identification and characterization of crystalline substances. This is critical across a range of scientific and engineering disciplines, including materials science, solid-state physics, and chemistry. Its adoption has streamlined data analysis and enhanced the speed at which materials can be studied since its original formulation, and simplified the processes involved.